caa a22 4500 445820551 CHVBK 20180317145242.0 cr unu---uuuuu 170323e20110601xx s 000 0 eng 10.1007/s10825-010-0318-7 doi (NATIONALLICENCE)springer-10.1007/s10825-010-0318-7 Study the effect of distribution of density of states on the subthreshold characteristics of an organic field-effect transistor (OFET) [Elektronische Daten] [Arash Takshi, John Madden] In the existing theory for organic field-effect transistors (OFETs) the effect of molecular order on the subthreshold characteristics is ignored. This effect is studied analytically through the potential profile and subthreshold swing at a weak accumulation mode. The developed theory predicts a wide accumulation region and a low subthreshold swing for a poorly ordered semiconductor. Simulation of transistors with various distributions of density of states is performed to mimic OFETs made of regioregular-Poly 3 hexylthiophene (rr-P3HT). The simulation results support the analytical equation for the potential profile. Furthermore, the effect of molecular order on the subthreshold swing matches with the theory. However, the analytical value for the subthreshold swing is greatly underestimated mainly due to an oversimplified model used for mobility. Springer Science+Business Media LLC, 2010 Organic field-effect transistor (OFET) nationallicence Density of states (DOS) nationallicence Subthreshold swing nationallicence Weak accumulation nationallicence Regioregular poly 3-hexylthiophene (rr-P3HT) nationallicence Takshi Arash University of South Florida, Department of Electrical Engineering, 33620, Tampa, FL, USA aut Madden John Department of Electrical and Computer Engineering and Advanced Materials & Process Engineering Lab, University of British Columbia (UBC), Vancouver, BC V6T 1Z1, Canada aut Journal of Computational Electronics Springer US; http://www.springer-ny.com 10/1-2(2011-06-01), 154-162 1569-8025 10:1-2<154 2011 10 10825 https://doi.org/10.1007/s10825-010-0318-7 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10825-010-0318-7 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Takshi Arash University of South Florida, Department of Electrical Engineering, 33620, Tampa, FL, USA aut NATIONALLICENCE 700 1- Madden John Department of Electrical and Computer Engineering and Advanced Materials & Process Engineering Lab, University of British Columbia (UBC), Vancouver, BC V6T 1Z1, Canada aut NATIONALLICENCE 773 0- Journal of Computational Electronics Springer US; http://www.springer-ny.com 10/1-2(2011-06-01), 154-162 1569-8025 10:1-2<154 2011 10 10825 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer