caa a22 4500 445820659 CHVBK 20180317145243.0 cr unu---uuuuu 170323e20110601xx s 000 0 eng 10.1007/s10825-010-0327-6 doi (NATIONALLICENCE)springer-10.1007/s10825-010-0327-6 Sano Nobuyuki Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennoudai, 305-8573, Tsukuba, Ibaraki, Japan aut Impact of the Coulomb interaction on nano-scale silicon device characteristics [Elektronische Daten] [Nobuyuki Sano] Monte Carlo simulations coupled self-consistently with the three-dimensional Poisson equation are carried out under the double-gate MOSFET structures. The Coulomb force experienced by an electron inside the device is directly evaluated by performing the Monte Carlo simulations with or without the full Coulomb interaction and the Coulomb force on the channel electron corresponding to plasmon excitations is clarified. It is pointed out that the consistency of the boundary condition is achieved only if the long-range Coulomb interaction is properly taken into account, and this is crucial for predicting reliable device characteristics in ultra-small devices. The drain current and transconductance are greatly reduced if the self-consistent potential fluctuations are taken into account. Springer Science+Business Media LLC, 2010 Quasi-ballistic transport nationallicence Monte Carlo nationallicence Device simulation nationallicence Coulomb interaction nationallicence MOSFET nationallicence Journal of Computational Electronics Springer US; http://www.springer-ny.com 10/1-2(2011-06-01), 98-103 1569-8025 10:1-2<98 2011 10 10825 https://doi.org/10.1007/s10825-010-0327-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10825-010-0327-6 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Sano Nobuyuki Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennoudai, 305-8573, Tsukuba, Ibaraki, Japan aut NATIONALLICENCE 773 0- Journal of Computational Electronics Springer US; http://www.springer-ny.com 10/1-2(2011-06-01), 98-103 1569-8025 10:1-2<98 2011 10 10825 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer