caa a22 4500 445826444 CHVBK 20180317145300.0 cr unu---uuuuu 170323e20110601xx s 000 0 eng 10.1007/s10854-010-0198-4 doi (NATIONALLICENCE)springer-10.1007/s10854-010-0198-4 In situ optical inspection of electrochemical migration during THB tests [Elektronische Daten] [Bálint Medgyes, Balázs Illés, Richárd Berényi, Gábor Harsányi] In order to get more information about the process of electrochemical migration (ECM), a novel in situ optical inspection system was developed and tested. The optical inspection system is applicable for real time in situ investigation to observe water condensation and dendrite growth during Thermal Humidity Bias (THB) tests. In this paper, a real time observation of water condensation and dendrite growth is studied on immersion silver (iAg), bare copper (Cu) and galvanic tin (gSn) interdigital (double comb) patterns prepared on FR4 substrate during Dew Point THB test. The real time in situ optical investigations were verified by real time voltage measurements, which are presented in the paper as well. The result shows that the water condensation mainly starts on the metal surface, which is an unexpected phenomenon since the preliminary condition of ECM is the presence of a continuous moisture film between the metallization stripes, e.g. on the surface of the insulation board material. Springer Science+Business Media, LLC, 2010 Medgyes Bálint Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut Illés Balázs Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut Berényi Richárd Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut Harsányi Gábor Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/6(2011-06-01), 694-700 0957-4522 22:6<694 2011 22 10854 https://doi.org/10.1007/s10854-010-0198-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-010-0198-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Medgyes Bálint Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut NATIONALLICENCE 700 1- Illés Balázs Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut NATIONALLICENCE 700 1- Berényi Richárd Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut NATIONALLICENCE 700 1- Harsányi Gábor Department of Electronics Technology, Budapest University of Technology and Economics, Goldmann György tér 3, 1111, Budapest, Hungary aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/6(2011-06-01), 694-700 0957-4522 22:6<694 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer