caa a22 4500 44582669X CHVBK 20180317145301.0 cr unu---uuuuu 170323e20110901xx s 000 0 eng 10.1007/s10854-011-0326-9 doi (NATIONALLICENCE)springer-10.1007/s10854-011-0326-9 Investigation of structural, electrical and optical properties of nickel substituted CdSe thin films [Elektronische Daten] [B. Jadhav, P. Hankare, S. Delekar] The technologically important Cd1−xNixSe thin films with variable compositions (0≤x≤1) have been developed by a chemical deposition method. The structural, compositional, optical and electrical properties were studied by X-ray diffraction, Scanning electron microscopy, Atomic absorption spectroscopy, UV-visible double beam spectrophotometer and d.c. two probe method. XRD studies indicate polycrystalline in nature with hexagonal phase for all the samples. The lattice constants decrease with increase in nickel content in CdSe host lattice. The surface morphology study of all samples reveals uniform and spherical grains. An optical study of the samples shows that band gap value decreases with nickel content. Electrical measurements depict semiconducting properties of all samples. Springer Science+Business Media, LLC, 2011 Jadhav B. Department of Chemistry, Shivaji University, 416 004, Kolhapur, Maharashtra, India aut Hankare P. Department of Chemistry, Shivaji University, 416 004, Kolhapur, Maharashtra, India aut Delekar S. Department of Chemistry, Dr.B.A.M.University, 413501, Sub-Campus Osmanabad, Maharashtra, India aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/9(2011-09-01), 1433-1442 0957-4522 22:9<1433 2011 22 10854 https://doi.org/10.1007/s10854-011-0326-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-011-0326-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Jadhav B. Department of Chemistry, Shivaji University, 416 004, Kolhapur, Maharashtra, India aut NATIONALLICENCE 700 1- Hankare P. Department of Chemistry, Shivaji University, 416 004, Kolhapur, Maharashtra, India aut NATIONALLICENCE 700 1- Delekar S. Department of Chemistry, Dr.B.A.M.University, 413501, Sub-Campus Osmanabad, Maharashtra, India aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/9(2011-09-01), 1433-1442 0957-4522 22:9<1433 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer