caa a22 4500 445827777 CHVBK 20180317145304.0 cr unu---uuuuu 170323e20110301xx s 000 0 eng 10.1007/s10854-010-0119-6 doi (NATIONALLICENCE)springer-10.1007/s10854-010-0119-6 Structural, spectroscopic and microwave characterizations of (Sm0.5Y0.5)Ti(Nb1− x Ta x )O6 ceramics [Elektronische Daten] [James Joseph, Shyla Joseph, Annamma John, J. Thomas, V. Prasad, Sam Solomon] Microwave dielectric ceramics of the type (Sm0.5Y0.5)Ti(Nb1−x Tax)O6 were prepared for x=0, 0.2, 0.4, 0.6, 0.8 and 1 through the conventional solid state ceramic route. The ball-milled compositions were calcined at 1,250°C. The cylindrical pellets were sintered at temperatures between 1,385 and 1,450°C. The densities were determined by Archimedes method. The structure was analyzed using X-ray diffraction method. The microwave dielectric properties of the polished pellets were measured using cavity resonator method. The morphological studies were done using Scanning Electron Microscopy and Transmission Electron Microscopy. The Raman spectra were recorded and analyzed to confirm the structural change. The photoluminescence spectra were also taken and the emission lines were identified. A correlation study was done among the measured properties and parameters. Most of the samples have high dielectric constant, high quality factor and low temperature coefficient of resonant frequency and hence suitable for microwave applications. Springer Science+Business Media, LLC, 2010 Joseph James Department of Chemistry, St. John's College, 691 306, Anchal, Kerala, India aut Joseph Shyla Department of Physics, St. John's College, 691 306, Anchal, Kerala, India aut John Annamma Department of Physics, St. John's College, 691 306, Anchal, Kerala, India aut Thomas J. Department of Physics, Mar Ivanios College, 695 015, Thiruvananthapuram, Kerala, India aut Prasad V. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology, 695 019, Thiruvananthapuram, Kerala, India aut Solomon Sam Department of Physics, St. John's College, 691 306, Anchal, Kerala, India aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/3(2011-03-01), 228-232 0957-4522 22:3<228 2011 22 10854 https://doi.org/10.1007/s10854-010-0119-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-010-0119-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Joseph James Department of Chemistry, St. John's College, 691 306, Anchal, Kerala, India aut NATIONALLICENCE 700 1- Joseph Shyla Department of Physics, St. John's College, 691 306, Anchal, Kerala, India aut NATIONALLICENCE 700 1- John Annamma Department of Physics, St. John's College, 691 306, Anchal, Kerala, India aut NATIONALLICENCE 700 1- Thomas J. Department of Physics, Mar Ivanios College, 695 015, Thiruvananthapuram, Kerala, India aut NATIONALLICENCE 700 1- Prasad V. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology, 695 019, Thiruvananthapuram, Kerala, India aut NATIONALLICENCE 700 1- Solomon Sam Department of Physics, St. John's College, 691 306, Anchal, Kerala, India aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/3(2011-03-01), 228-232 0957-4522 22:3<228 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer