caa a22 4500 445827882 CHVBK 20180317145304.0 cr unu---uuuuu 170323e20111001xx s 000 0 eng 10.1007/s10854-011-0500-0 doi (NATIONALLICENCE)springer-10.1007/s10854-011-0500-0 Screening for counterfeit electronic parts [Elektronische Daten] [Bhanu Sood, Diganta Das, Michael Pecht] Counterfeit electronic parts have become a significant cause of worry in the electronic parts supply chain. Counterfeit parts detected in the electronics industry can be new or surplus parts that are modified in some manner, or they can be salvaged scrap parts that are refurbished to look like new. In the latter case, the packaging of these parts is altered to modify their identity or disguise the effects of salvaging. The modification can be as simple as the removal of old markings and the addition of new markings, or as complicated as the recovery of a die and repackaging in a new package. In this paper, we discuss the types of parts used to create counterfeit semiconductor parts and the defects/degradation inherent in these parts due to the nature of the sources they come from. We also discuss proposed inspection standards and their limitations. The processes used to modify the packaging of these parts to create counterfeits are then discussed along with the traces left behind from each of the processes. We then present a methodology for detecting signs of possible part modifications to determine the risk of a part or part lot being counterfeit. Springer Science+Business Media, LLC, 2011 Sood Bhanu Center for Advanced Life Cycle Engineering (CALCE), Department of Mechanical Engineering, University of Maryland, 20742, College Park, MD, USA aut Das Diganta Center for Advanced Life Cycle Engineering (CALCE), Department of Mechanical Engineering, University of Maryland, 20742, College Park, MD, USA aut Pecht Michael Center for Advanced Life Cycle Engineering (CALCE), Department of Mechanical Engineering, University of Maryland, 20742, College Park, MD, USA aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/10(2011-10-01), 1511-1522 0957-4522 22:10<1511 2011 22 10854 https://doi.org/10.1007/s10854-011-0500-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-011-0500-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Sood Bhanu Center for Advanced Life Cycle Engineering (CALCE), Department of Mechanical Engineering, University of Maryland, 20742, College Park, MD, USA aut NATIONALLICENCE 700 1- Das Diganta Center for Advanced Life Cycle Engineering (CALCE), Department of Mechanical Engineering, University of Maryland, 20742, College Park, MD, USA aut NATIONALLICENCE 700 1- Pecht Michael Center for Advanced Life Cycle Engineering (CALCE), Department of Mechanical Engineering, University of Maryland, 20742, College Park, MD, USA aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/10(2011-10-01), 1511-1522 0957-4522 22:10<1511 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer