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   <subfield code="a">Dielectric relaxation phenomena in the compound: LiCo3/5Mn1/5Cu1/5VO4</subfield>
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   <subfield code="a">Solution-based chemical method has been used to produce LiCo3/5Mn1/5Cu1/5VO4 ceramics. The formation of the compound is checked by X-ray diffraction analysis and it reveals an orthorhombic unit cell structure with lattice parameters of a=9.8262 Å, b=3.0706 Å, c=14.0789 Å. Field emission scanning electron micrograph indicates a polycrystalline texture of the material with grains of unequal sizes (~0.2 to 3μm). Complex impedance spectroscopy technique is used to study the dielectric properties. Temperature dependence of dielectric constant (ε r) at various frequencies exhibits the dielectric anomalies in ε r at T c (transition temperature)=245, 255, 260 and 265°C with (εr)max. ~458, 311, 214 and 139 for 50, 100, 200 and 500kHz, respectively. Frequency dependence of tangent loss at various temperatures shows the presence of dielectric relaxation in the material.</subfield>
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