<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">445828145</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180317145305.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170323e20110401xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s10854-010-0140-9</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s10854-010-0140-9</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Effects of Nd-substitution on microstructures and dielectric characteristics of CaCu3Ti4O12 ceramics</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Ying Wang, Lei Ni, Xiang Chen]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">Ca1−3x/2NdxCu3Ti4O12 (x=0, 0.1, 0.2) ceramics were prepared by a solid state reaction process, and single-phased structures were obtained for all the compositions. The dielectric characteristics of pure and Nd-substituted CaCu3Ti4O12 ceramics were investigated together with the microstructures. The mixed-valent structures of Cu+/Cu2+ and Ti3+/Ti4+ in the present ceramics were confirmed by X-ray photoelectron analysis. The dielectric relaxation in the low temperature range was examined in detail and the variation of dielectric constant and dielectric loss was attributed to the modification mixed-valent structures.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Springer Science+Business Media, LLC, 2010</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Wang</subfield>
   <subfield code="D">Ying</subfield>
   <subfield code="u">Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, 310027, Hangzhou, China</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Ni</subfield>
   <subfield code="D">Lei</subfield>
   <subfield code="u">Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, 310027, Hangzhou, China</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Chen</subfield>
   <subfield code="D">Xiang</subfield>
   <subfield code="u">Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, 310027, Hangzhou, China</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Materials Science: Materials in Electronics</subfield>
   <subfield code="d">Springer US; http://www.springer-ny.com</subfield>
   <subfield code="g">22/4(2011-04-01), 345-350</subfield>
   <subfield code="x">0957-4522</subfield>
   <subfield code="q">22:4&lt;345</subfield>
   <subfield code="1">2011</subfield>
   <subfield code="2">22</subfield>
   <subfield code="o">10854</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s10854-010-0140-9</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s10854-010-0140-9</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Wang</subfield>
   <subfield code="D">Ying</subfield>
   <subfield code="u">Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, 310027, Hangzhou, China</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Ni</subfield>
   <subfield code="D">Lei</subfield>
   <subfield code="u">Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, 310027, Hangzhou, China</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Chen</subfield>
   <subfield code="D">Xiang</subfield>
   <subfield code="u">Laboratory of Dielectric Materials, Department of Materials Science and Engineering, Zhejiang University, 310027, Hangzhou, China</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Materials Science: Materials in Electronics</subfield>
   <subfield code="d">Springer US; http://www.springer-ny.com</subfield>
   <subfield code="g">22/4(2011-04-01), 345-350</subfield>
   <subfield code="x">0957-4522</subfield>
   <subfield code="q">22:4&lt;345</subfield>
   <subfield code="1">2011</subfield>
   <subfield code="2">22</subfield>
   <subfield code="o">10854</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
