caa a22 4500 445828218 CHVBK 20180317145305.0 cr unu---uuuuu 170323e20110801xx s 000 0 eng 10.1007/s10854-010-0266-9 doi (NATIONALLICENCE)springer-10.1007/s10854-010-0266-9 Electrical behavior of silver particulate films deposited on 8MeV electron beam irradiated softened polystyrene substrates [Elektronische Daten] [Manjunatha Pattabi, S. Gurumurthy, Ganesh Sanjeev, A. Gaikwad] Results of the investigations carried out on the electrical behavior of silver particulate films deposited on electron beam irradiated polystyrene (PS) coated substrates held at a temperature of 455K in a vacuum of 8×10−6 torr at a constant deposition rate of 0.4nm/s are reported. It is known that when metals are evaporated on to softened polymer substrates, subsurface particulate structures are formed whose morphology is dependent on deposition parameters. Further, it was shown that the morphology is dependent on polymer-metal interaction. The present work demonstrates that the polymer-metal interaction can be brought about in inert polymers like PS by electron irradiation. The results indicate that the films deposited on PS irradiated to a dose of 20 and 25kGy gives rise to smaller clusters with smaller inter-cluster separation, better suited for sensor applications. The induced polymer-metal interaction is attributed to the creation of free radicals due to the 8MeV electron irradiation. Springer Science+Business Media, LLC, 2010 Pattabi Manjunatha Materials Science Department, Mangalore University, 574199, Mangalagangotri, India aut Gurumurthy S. Materials Science Department, Mangalore University, 574199, Mangalagangotri, India aut Sanjeev Ganesh Microtron Centre, Mangalore University, 574199, Mangalagangotri, India aut Gaikwad A. CMC, National Chemical Laboratory, 411008, Pune, India aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/8(2011-08-01), 1095-1100 0957-4522 22:8<1095 2011 22 10854 https://doi.org/10.1007/s10854-010-0266-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-010-0266-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Pattabi Manjunatha Materials Science Department, Mangalore University, 574199, Mangalagangotri, India aut NATIONALLICENCE 700 1- Gurumurthy S. Materials Science Department, Mangalore University, 574199, Mangalagangotri, India aut NATIONALLICENCE 700 1- Sanjeev Ganesh Microtron Centre, Mangalore University, 574199, Mangalagangotri, India aut NATIONALLICENCE 700 1- Gaikwad A. CMC, National Chemical Laboratory, 411008, Pune, India aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/8(2011-08-01), 1095-1100 0957-4522 22:8<1095 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer