caa a22 4500 445828447 CHVBK 20180317145306.0 cr unu---uuuuu 170323e20110801xx s 000 0 eng 10.1007/s10854-010-0250-4 doi (NATIONALLICENCE)springer-10.1007/s10854-010-0250-4 Electrical and thermal properties of PTFE-Sr2ZnSi2O7 composites [Elektronische Daten] [T. Joseph, S. Uma, J. Philip, M. Sebastian] A new polymer-ceramic composite was prepared using PTFE and low loss Sr2ZnSi2O7. The dielectric properties of the composite were studied in the microwave and radiofrequency ranges. The relative permittivity (εr) and dielectric loss (tan δ) increased with the filler loading from 0.10 to 0.50 volume fractions (vf). The observed values of εr, thermal conductivity and coefficient of thermal expansion (CTE) were compared with the corresponding theoretical predictions. The ability of the composite towards moisture absorption resistance was studied as a function of filler loading. It was also found that the variation of εr was less than 2% in the temperature range 25-90 °C, at 1MHz. For a filler content of 0.50 vf, the PTFE/Sr2ZnSi2O7 composite exhibited εr=4.4, tan δ=0.003 (at 4-6GHz), CTE=38.3ppm/°C, thermal conductivity=2.1W/mK and moisture absorption=0.09 wt%. Springer Science+Business Media, LLC, 2010 Joseph T. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), 695019, Trivandrum, India aut Uma S. Sophisticated Test and Instrumentation Centre, Cochin University of Science and Technology, 682022, Kochi, India aut Philip J. Sophisticated Test and Instrumentation Centre, Cochin University of Science and Technology, 682022, Kochi, India aut Sebastian M. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), 695019, Trivandrum, India aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/8(2011-08-01), 1000-1009 0957-4522 22:8<1000 2011 22 10854 https://doi.org/10.1007/s10854-010-0250-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-010-0250-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Joseph T. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), 695019, Trivandrum, India aut NATIONALLICENCE 700 1- Uma S. Sophisticated Test and Instrumentation Centre, Cochin University of Science and Technology, 682022, Kochi, India aut NATIONALLICENCE 700 1- Philip J. Sophisticated Test and Instrumentation Centre, Cochin University of Science and Technology, 682022, Kochi, India aut NATIONALLICENCE 700 1- Sebastian M. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), 695019, Trivandrum, India aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/8(2011-08-01), 1000-1009 0957-4522 22:8<1000 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer