caa a22 4500 445828749 CHVBK 20180317145307.0 cr unu---uuuuu 170323e20110501xx s 000 0 eng 10.1007/s10854-010-0166-z doi (NATIONALLICENCE)springer-10.1007/s10854-010-0166-z Optical, structural and surface characterization of CdO:Mg films [Elektronische Daten] [F. Atay, I. Akyuz, S. Kose, E. Ketenci, V. Bilgin] In this work, we have tried to improve some physical properties of CdO films by Mg doping. Ultrasonic spray pyrolysis technique has been used to obtain the films. Thicknesses and refractive indices of the films have been determined by Spectroscopic ellipsometry technique using Cauchy-Urbach model for fitting. Transmission and reflectance spectra have been taken by UV Spectrophotometer, and band gap values have been determined by optical method. X-ray diffraction patterns have been used to study the structural properties. Texture coefficient, grain size and lattice constants have also been determined. AFM images have been taken to see the effect of Mg doping on surface topography and roughness of CdO films. Finally, it has been concluded that Mg doped CdO films (especially at 4%) have improved properties and are good candidates for photovoltaic applications. Springer Science+Business Media, LLC, 2010 Atay F. Department of Physics, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut Akyuz I. Department of Physics, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut Kose S. Department of Physics, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut Ketenci E. Graduate School of Science, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut Bilgin V. Department of Physics, Canakkale Onsekiz Mart University, 17100, Canakkale, Turkey aut Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/5(2011-05-01), 492-498 0957-4522 22:5<492 2011 22 10854 https://doi.org/10.1007/s10854-010-0166-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10854-010-0166-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Atay F. Department of Physics, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut NATIONALLICENCE 700 1- Akyuz I. Department of Physics, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut NATIONALLICENCE 700 1- Kose S. Department of Physics, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut NATIONALLICENCE 700 1- Ketenci E. Graduate School of Science, Eskisehir Osmangazi University, 26480, Eskisehir, Turkey aut NATIONALLICENCE 700 1- Bilgin V. Department of Physics, Canakkale Onsekiz Mart University, 17100, Canakkale, Turkey aut NATIONALLICENCE 773 0- Journal of Materials Science: Materials in Electronics Springer US; http://www.springer-ny.com 22/5(2011-05-01), 492-498 0957-4522 22:5<492 2011 22 10854 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer