caa a22 4500 445865008 CHVBK 20180317145455.0 cr unu---uuuuu 170323e20110901xx s 000 0 eng 10.1140/epjd/e2011-10703-6 doi (NATIONALLICENCE)springer-10.1140/epjd/e2011-10703-6 Subwavelength dark hollow focus of spirally polarized axisymmetric Bessel-modulated Gaussian beam [Elektronische Daten] [X. M. Gao, Q.F. Zhan, Q. Wang, M.J. Yun, H.M. Guo, S.L. Zhuang] Abstract.: Dark hollow focus plays an important role in many optical systems. In this paper, dark hollow focal shaping of spirally polarized axisymmetric Bessel-modulated Gaussian beam is investigated by vector diffraction theory in detail. Results show that the dark hollow focus can be altered considerably by beam parameter and spiral parameter that indicates polarization spiral degree. One dark hollow focus and two dark hollow foci pattern may occur for certain spiral parameter, and the transverse size of dark hollow focus can be less than the diffraction limit size of bright focus. In addition, there may also appear two triangle dark hollow foci that are connected by one dark line focus. EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg, 2011 Gao X. M. Electronics and Information College, Hangzhou Dianzi University, 310018, Hangzhou, P.R. China aut Zhan Q.F. China Standard Software Co., Ltd, 200030, Shanghai, P.R. China aut Wang Q. Shanghai Key Laboratory of Modern Optics System, University of shanghai for Science and Technology, 200093, Shanghai, P.R. China aut Yun M.J. College of Physics Science, Qingdao University, 266071, Qingdao, P.R. China aut Guo H.M. Shanghai Key Laboratory of Modern Optics System, University of shanghai for Science and Technology, 200093, Shanghai, P.R. China aut Zhuang S.L. Shanghai Key Laboratory of Modern Optics System, University of shanghai for Science and Technology, 200093, Shanghai, P.R. China aut The European Physical Journal D Springer-Verlag 64/1(2011-09-01), 103-108 1434-6060 64:1<103 2011 64 10053 https://doi.org/10.1140/epjd/e2011-10703-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1140/epjd/e2011-10703-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Gao X. M. Electronics and Information College, Hangzhou Dianzi University, 310018, Hangzhou, P.R. China aut NATIONALLICENCE 700 1- Zhan Q.F. China Standard Software Co., Ltd, 200030, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Wang Q. Shanghai Key Laboratory of Modern Optics System, University of shanghai for Science and Technology, 200093, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Yun M.J. College of Physics Science, Qingdao University, 266071, Qingdao, P.R. China aut NATIONALLICENCE 700 1- Guo H.M. Shanghai Key Laboratory of Modern Optics System, University of shanghai for Science and Technology, 200093, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Zhuang S.L. Shanghai Key Laboratory of Modern Optics System, University of shanghai for Science and Technology, 200093, Shanghai, P.R. China aut NATIONALLICENCE 773 0- The European Physical Journal D Springer-Verlag 64/1(2011-09-01), 103-108 1434-6060 64:1<103 2011 64 10053 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer