Application of the four-probe method for measuring the resistivity of nonuniform semiconductor materials

Verfasser / Beitragende:
[A. Meier, D. Levinzon]
Ort, Verlag, Jahr:
1965
Enthalten in:
Measurement Techniques, 8/5(1965-05-01), 427-429
Format:
Artikel (online)
ID: 44942040X