Device for testing high-precision hole gauges with scale factors of 0.001 and 0.002 mm

Verfasser / Beitragende:
[é. Yanushkevich]
Ort, Verlag, Jahr:
1965
Enthalten in:
Measurement Techniques, 8/2(1965-02-01), 135-136
Format:
Artikel (online)
ID: 449420760