Criterion for normalizing reliability and repairability indexes of electronic medical devices

Verfasser / Beitragende:
[A. Vladov, Yu. Kabatov]
Ort, Verlag, Jahr:
1968
Enthalten in:
Biomedical Engineering, 2/1(1968-01-01), 17-21
Format:
Artikel (online)
ID: 45027912X