Electron microscope examination of the surface topography of ion-bombarded copper

Verfasser / Beitragende:
[D. Mazey, R. Nelson, P. Thackery]
Ort, Verlag, Jahr:
1968
Enthalten in:
Journal of Materials Science, 3/1(1968-01-01), 26-32
Format:
Artikel (online)
ID: 450281264