Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga+ and C 60 + projectiles

Verfasser / Beitragende:
[Nimer Wehbe, Taoufiq Mouhib, Aneesh Prabhakaran, Patrick Bertrand, Arnaud Delcorte]
Ort, Verlag, Jahr:
2009
Enthalten in:
Journal of the American Society for Mass Spectrometry, 20/12(2009-12-01), 2294-2303
Format:
Artikel (online)
ID: 453608574