X-ray diffraction study of the composition and strain fields in buried SiGe islands

Verfasser / Beitragende:
[N. Hrauda, J. J. Zhang, M. Stoffel, J. Stangl, G. Bauer, A. Rehman-Khan, V. Holý, O. G. Schmidt, V. Jovanovic, L. K. Nanver]
Ort, Verlag, Jahr:
2009
Enthalten in:
The European Physical Journal Special Topics, 167/1(2009-02-01), 41-46
Format:
Artikel (online)
ID: 453619533