Ellipsometry of GeO2 films with Ge nanoclusters: Influence of the quantum-size effect on refractive index

Verfasser / Beitragende:
[D. Marin, E. Gorokhov, A. Borisov, V. Volodin]
Ort, Verlag, Jahr:
2009
Enthalten in:
Optics and Spectroscopy, 106/3(2009-03-01), 436-440
Format:
Artikel (online)
ID: 453639259