A method for considering the nonlinearity of the photorefractive effect with respect to the pump power in the analysis of electronic and thermal parameters of silicon structures

Verfasser / Beitragende:
[A. Filatov, A. Lugovskoi]
Ort, Verlag, Jahr:
2009
Enthalten in:
Journal of Communications Technology and Electronics, 54/5(2009-05-01), 583-587
Format:
Artikel (online)
ID: 45366704X