Investigation of the effect of frustration on the critical properties of the 3D Heisenberg antiferromagnetic model
Gespeichert in:
Verfasser / Beitragende:
[A. Murtazaev, M. Ramazanov, M. Badiev]
Ort, Verlag, Jahr:
2009
Enthalten in:
Journal of Communications Technology and Electronics, 54/2(2009-02-01), 191-196
Format:
Artikel (online)
Online Zugang: