caa a22 4500 463206363 CHVBK 20180405153127.0 cr unu---uuuuu 170326e20070601xx s 000 0 eng 10.1007/s00202-006-0029-z doi (NATIONALLICENCE)springer-10.1007/s00202-006-0029-z Analysis of Surface Degradation of Silicone Rubber Insulation Due to Tracking Under Different Voltage Profiles [Elektronische Daten] [S. Chandrasekar, R. Sarathi, M. Danikas] Tracking is basically a carbonaceous process. In the present study, the tracking phenomenon in silicone rubber material has been studied under AC and DC voltage. The influence of applied voltage magnitude, conductivity, and flow rate of the contaminant on tracking, were analyzed. It is observed that the tracking is more severe under DC voltages. The tracking time is less under negative DC voltage compared to the positive DC voltage. The tracking mechanism is explained in detail. The leakage current during the tracking studies was measured and its trends were analyzed by using the moving average technique. The leakage current magnitude is high with thermally aged specimens when compared to the virgin specimen, irrespective of the type of applied voltage. It is realized that the tracking time and the leakage current magnitude shows an inverse relationship. In addition, the surface condition of the insulation material was analyzed with the water aged specimen and the diffusion coefficient of the material was calculated. The reduction in contact angle of the specimen has direct impact in the reduction of its tracking time. The tensile test and DMA test results indicate that thermal aging of the specimen alter the mechanical properties of the material. The activation energy of the material was calculated through DMA studies, indicating that materials with high activation energy show an increase in tracking time of the specimen. Springer-Verlag, 2006 Silicone rubber nationallicence Tracking nationallicence Moving average nationallicence Leakage current nationallicence Contact angle nationallicence Diffusion coefficient nationallicence Activation energy nationallicence WAXD nationallicence TG-DTA nationallicence Tensile test nationallicence DMA test nationallicence Chandrasekar S. Department of Electrical Engineering, Indian Institute of Technology Madras, 600 036, Chennai, India aut Sarathi R. Department of Electrical Engineering, Indian Institute of Technology Madras, 600 036, Chennai, India aut Danikas M. Department of Electrical and Computer Engineering, Democritus University of Thrace, 671 00, Xanthi, Greece aut Electrical Engineering Springer-Verlag 89/6(2007-06-01), 489-501 0948-7921 89:6<489 2007 89 202 https://doi.org/10.1007/s00202-006-0029-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00202-006-0029-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chandrasekar S. Department of Electrical Engineering, Indian Institute of Technology Madras, 600 036, Chennai, India aut NATIONALLICENCE 700 1- Sarathi R. Department of Electrical Engineering, Indian Institute of Technology Madras, 600 036, Chennai, India aut NATIONALLICENCE 700 1- Danikas M. Department of Electrical and Computer Engineering, Democritus University of Thrace, 671 00, Xanthi, Greece aut NATIONALLICENCE 773 0- Electrical Engineering Springer-Verlag 89/6(2007-06-01), 489-501 0948-7921 89:6<489 2007 89 202 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer