caa a22 4500 463211286 CHVBK 20180405153141.0 cr unu---uuuuu 170326e20070701xx s 000 0 eng 10.1007/s00339-007-3944-6 doi (NATIONALLICENCE)springer-10.1007/s00339-007-3944-6 Nanoscale determination of surface orientation and electrostatic properties of ZnO thin films [Elektronische Daten] [J. Zúñiga-Pérez, E. Palacios-Lidón, V. Muñoz-Sanjosé, J. Colchero] Scanning force microscopy related techniques are applied to study surface nanoscale properties. We show that nanogoniometry can be combined with local electrostatic measurements - electrostatic force microscopy and Kelvin probe microscopy - to identify surface planes families and to study their local electrical properties. The scanning force microscopy techniques employed are analyzed and the correct way of acquiring and interpreting data is discussed in detail. The experiments performed on ZnO films grown along the nonpolar [112̄0] direction show that these films completely facet into {101̄1} and {101̄1̄} planes, which follow a well defined pattern of surface potential along the [0001] direction. This pattern is explained in terms of the different ionic termination - Zn or O ions - of the exposed facets. Finally, the presence of inversion domain boundaries is discussed. Springer-Verlag, 2007 Zúñiga-Pérez J. Departament de Física Aplicada i Electromagnetisme, Universitat de València, C/Dr. Moliner 50, 46100, Burjassot, Spain aut Palacios-Lidón E. Departamento de Física, Facultad de Química, Campus Espinardo, Universidad de Murcia, 30100, Murcia, Spain aut Muñoz-Sanjosé V. Departament de Física Aplicada i Electromagnetisme, Universitat de València, C/Dr. Moliner 50, 46100, Burjassot, Spain aut Colchero J. Departamento de Física, Facultad de Química, Campus Espinardo, Universidad de Murcia, 30100, Murcia, Spain aut Applied Physics A Springer-Verlag 88/1(2007-07-01), 77-82 0947-8396 88:1<77 2007 88 339 https://doi.org/10.1007/s00339-007-3944-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00339-007-3944-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Zúñiga-Pérez J. Departament de Física Aplicada i Electromagnetisme, Universitat de València, C/Dr. Moliner 50, 46100, Burjassot, Spain aut NATIONALLICENCE 700 1- Palacios-Lidón E. Departamento de Física, Facultad de Química, Campus Espinardo, Universidad de Murcia, 30100, Murcia, Spain aut NATIONALLICENCE 700 1- Muñoz-Sanjosé V. Departament de Física Aplicada i Electromagnetisme, Universitat de València, C/Dr. Moliner 50, 46100, Burjassot, Spain aut NATIONALLICENCE 700 1- Colchero J. Departamento de Física, Facultad de Química, Campus Espinardo, Universidad de Murcia, 30100, Murcia, Spain aut NATIONALLICENCE 773 0- Applied Physics A Springer-Verlag 88/1(2007-07-01), 77-82 0947-8396 88:1<77 2007 88 339 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer