caa a22 4500 463211871 CHVBK 20180405153143.0 cr unu---uuuuu 170326e20070801xx s 000 0 eng 10.1007/s00339-007-3927-7 doi (NATIONALLICENCE)springer-10.1007/s00339-007-3927-7 Probing induced defects in individual carbon nanotubes using electrostatic force microscopy [Elektronische Daten] [T. Sand Jespersen, J. Nygård] Structural defects greatly affect the electronic properties of single wall carbon nanotubes (CNT's), for instance by increasing the sensitivity to their environment; an effect which can be utilized for better performance of CNT based chemical sensors. Here we show that electrostatic force microscopy (EFM) can be used as a non-invasive technique for probing defects in individual CNT's supported on insulating substrates. The technique is demonstrated by monitoring the change in EFM signal upon intentionally inducing defect by an oxygen plasma etch, and is applied to assess the quality of as-grown CNT samples and to study the effect of exposing CNT's to the low energy electron irradiation of a scanning electron microscope (SEM). Springer-Verlag, 2007 Sand Jespersen T. Niels Bohr Institute, Nano-Science Center, University of Copenhagen, Universitetsparken 5, 2100, Copenhagen, Denmark aut Nygård J. Niels Bohr Institute, Nano-Science Center, University of Copenhagen, Universitetsparken 5, 2100, Copenhagen, Denmark aut Applied Physics A Springer-Verlag 88/2(2007-08-01), 309-313 0947-8396 88:2<309 2007 88 339 https://doi.org/10.1007/s00339-007-3927-7 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00339-007-3927-7 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Sand Jespersen T. Niels Bohr Institute, Nano-Science Center, University of Copenhagen, Universitetsparken 5, 2100, Copenhagen, Denmark aut NATIONALLICENCE 700 1- Nygård J. Niels Bohr Institute, Nano-Science Center, University of Copenhagen, Universitetsparken 5, 2100, Copenhagen, Denmark aut NATIONALLICENCE 773 0- Applied Physics A Springer-Verlag 88/2(2007-08-01), 309-313 0947-8396 88:2<309 2007 88 339 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer