caa a22 4500 463212010 CHVBK 20180405153144.0 cr unu---uuuuu 170326e20070801xx s 000 0 eng 10.1007/s00339-007-3998-5 doi (NATIONALLICENCE)springer-10.1007/s00339-007-3998-5 Determination and analysis of the optical constants of thin films of nickel(II) and copper(II) hydrazone complexes by spectroscopic ellipsometry [Elektronische Daten] [Z.M. Chen, Y.Q. Wu, D.H. Gu, F.X. Gan] Thin films of four nickel(II) and copper(II) hydrazone complexes, which will hopefully be used as recording layers for the next-generation of high-density recordable disks, were prepared by using the spin-coating method. Absorption spectra of the thin films on K9 optical glass substrates in the 300-700nm wavelength region were measured. Optical constants (complex refractive indices N) and thickness d of the thin films prepared on single-crystal silicon substrates in the 275-675nm wavelength region were investigated on a rotating analyzer-polarizer scanning ellipsometer by fitting the measured ellipsometric angles (Ψ(λ) and Δ(λ)) with a 3-layer model (Si/dye film/air). The dielectric functions ε and absorption coefficients α as a function of the wavelength were then calculated. Additionally, a design to achieve high reflectivity and optimum dye film thickness with an appropriate reflective layer was performed with the Film Wizard software using a multilayered model (PC substrate/reflective layer/dye film/air) at 405nm wavelength. Springer-Verlag, 2007 Chen Z.M. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut Wu Y.Q. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut Gu D.H. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut Gan F.X. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut Applied Physics A Springer-Verlag 88/2(2007-08-01), 409-414 0947-8396 88:2<409 2007 88 339 https://doi.org/10.1007/s00339-007-3998-5 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00339-007-3998-5 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chen Z.M. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Wu Y.Q. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Gu D.H. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Gan F.X. Lab of High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 201800, Shanghai, P.R. China aut NATIONALLICENCE 773 0- Applied Physics A Springer-Verlag 88/2(2007-08-01), 409-414 0947-8396 88:2<409 2007 88 339 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer