caa a22 4500 463213394 CHVBK 20180405153148.0 cr unu---uuuuu 170326e20071101xx s 000 0 eng 10.1007/s00339-007-4134-2 doi (NATIONALLICENCE)springer-10.1007/s00339-007-4134-2 Photoemission study of SrTiO3 surface layers instability upon metal deposition [Elektronische Daten] [B. Psiuk, J. Szade, H. Schroeder, H. Haselier, M. Młynarczyk, R. Waser, K. Szot] In this work we study the Pt/SrTiO3 (STO) interface system using X-ray photoelectron spectroscopy (XPS). The polycrystalline Pt layers with a thickness of about 2-3nm are deposited by sputtering and thermal evaporation methods on STO(100) single crystals with two different type of terminations. We propose and show local conductivity (LC) measurements as a good method to check whether such very thin metal layers are continuous. The XPS data show that both methods of Pt deposition lead to changes of the chemical composition of the crystal surface layers, and such chemical instability should be taken into consideration when studying the physical properties of a metal-insulator interface. Springer-Verlag, 2007 Psiuk B. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut Szade J. A. Chełkowski Institute of Physics, University of Silesia, Universytecka 4, 40-007, Katowice, Poland aut Schroeder H. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut Haselier H. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut Młynarczyk M. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut Waser R. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut Szot K. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut Applied Physics A Springer-Verlag 89/2(2007-11-01), 451-455 0947-8396 89:2<451 2007 89 339 https://doi.org/10.1007/s00339-007-4134-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00339-007-4134-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Psiuk B. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut NATIONALLICENCE 700 1- Szade J. A. Chełkowski Institute of Physics, University of Silesia, Universytecka 4, 40-007, Katowice, Poland aut NATIONALLICENCE 700 1- Schroeder H. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut NATIONALLICENCE 700 1- Haselier H. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut NATIONALLICENCE 700 1- Młynarczyk M. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut NATIONALLICENCE 700 1- Waser R. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut NATIONALLICENCE 700 1- Szot K. Institute of Solid State and CNI - Center of Nanoelectronic Systems for Information Technology, Research Center Jülich GmbH, 52425, Jülich, Germany aut NATIONALLICENCE 773 0- Applied Physics A Springer-Verlag 89/2(2007-11-01), 451-455 0947-8396 89:2<451 2007 89 339 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer