caa a22 4500 463214315 CHVBK 20180405153151.0 cr unu---uuuuu 170326e20070301xx s 000 0 eng 10.1007/s00339-006-3768-9 doi (NATIONALLICENCE)springer-10.1007/s00339-006-3768-9 Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy [Elektronische Daten] [T. Jungk, Á. Hoffmann, E. Soergel] Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to electromechanical deformations. In the case of PFM one electrode is realized by a tip, therefore generating a strongly inhomogeneous electric field distribution inside the sample which reaches values up to 108V/m directly underneath the apex of the tip. Although often assumed, this high electric field does not lead to an enhancement of the electromechanical deformation of the sample. On the contrary, internal clamping of the material reduces the deformation as compared to the theoretically expected value which depends only on the voltage applied to the tip, thus being independent of the exact field distribution. Springer-Verlag, 2006 Jungk T. Institute of Physics, University of Bonn, Wegelerstraße 8, 53115, Bonn, Germany aut Hoffmann Á. Institute of Physics, University of Bonn, Wegelerstraße 8, 53115, Bonn, Germany aut Soergel E. Institute of Physics, University of Bonn, Wegelerstraße 8, 53115, Bonn, Germany aut Applied Physics A Springer-Verlag 86/3(2007-03-01), 353-355 0947-8396 86:3<353 2007 86 339 https://doi.org/10.1007/s00339-006-3768-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00339-006-3768-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Jungk T. Institute of Physics, University of Bonn, Wegelerstraße 8, 53115, Bonn, Germany aut NATIONALLICENCE 700 1- Hoffmann Á. Institute of Physics, University of Bonn, Wegelerstraße 8, 53115, Bonn, Germany aut NATIONALLICENCE 700 1- Soergel E. Institute of Physics, University of Bonn, Wegelerstraße 8, 53115, Bonn, Germany aut NATIONALLICENCE 773 0- Applied Physics A Springer-Verlag 86/3(2007-03-01), 353-355 0947-8396 86:3<353 2007 86 339 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer