caa a22 4500 463214935 CHVBK 20180405153153.0 cr unu---uuuuu 170326e20070401xx s 000 0 eng 10.1007/s00339-006-3855-y doi (NATIONALLICENCE)springer-10.1007/s00339-006-3855-y Infrared optical properties of BiFeO3 thin films prepared by chemical solution deposition [Elektronische Daten] [Y.W. Li, J.Q. Xue, J.L. Sun, X.J. Meng, Z.M. Huang, J.H. Chu, L.H. Ding, W.F. Zhang] BiFeO3 thin films have been grown on Pt(111)/Ti/SiO2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100cm-1 in total measured wavelength region and greater than 1000cm-1 at the wavelength region above 7.5μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors. Springer-Verlag, 2007 Li Y.W. School of Physics & Information Optoelectronics, He'nan University, 475004, Kaifeng, P.R. China aut Xue J.Q. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut Sun J.L. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut Meng X.J. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut Huang Z.M. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut Chu J.H. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut Ding L.H. School of Physics & Information Optoelectronics, He'nan University, 475004, Kaifeng, P.R. China aut Zhang W.F. School of Physics & Information Optoelectronics, He'nan University, 475004, Kaifeng, P.R. China aut Applied Physics A Springer-Verlag 87/1(2007-04-01), 125-128 0947-8396 87:1<125 2007 87 339 https://doi.org/10.1007/s00339-006-3855-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00339-006-3855-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Li Y.W. School of Physics & Information Optoelectronics, He'nan University, 475004, Kaifeng, P.R. China aut NATIONALLICENCE 700 1- Xue J.Q. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Sun J.L. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Meng X.J. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Huang Z.M. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Chu J.H. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083, Shanghai, P.R. China aut NATIONALLICENCE 700 1- Ding L.H. School of Physics & Information Optoelectronics, He'nan University, 475004, Kaifeng, P.R. China aut NATIONALLICENCE 700 1- Zhang W.F. School of Physics & Information Optoelectronics, He'nan University, 475004, Kaifeng, P.R. China aut NATIONALLICENCE 773 0- Applied Physics A Springer-Verlag 87/1(2007-04-01), 125-128 0947-8396 87:1<125 2007 87 339 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer