caa a22 4500 463221486 CHVBK 20180405153213.0 cr unu---uuuuu 170326e20070801xx s 000 0 eng 10.1007/s10853-006-1248-4 doi (NATIONALLICENCE)springer-10.1007/s10853-006-1248-4 Effect of 80 MeV oxygen ion beam irradiation on the properties of CdTe thin films [Elektronische Daten] [R. Sathyamoorthy, S. Chandramohan, P. Sudhagar, D. Kanjilal, D. Kabiraj, K. Asokan, K. Vijayakumar] Polycrystalline CdTe thin films were irradiated with 80MeV oxygen (O6+) ions for various fluences and its effect on the composition, structure, surface topography and optical properties have been investigated. The as-grown films are found to be slightly Te-rich in composition and there is no significant change in the composition after irradiation. X-ray diffraction analysis shows a high degree of crystallite orientation along the (111) plane of cubic phase CdTe. Upon irradiation a large decrease in intensity of the (111) plane and a small shift in the peak position has been resulted. The shift in the peak position is correlated with the change in the residual stress. The surface roughness of the films get increased after irradiation. A decrease in the grain size was observed after irradiation due to ion-induced recrystallization. The optical band gap energy decreased from 1.53eV for as-grown film to 1.46 eV upon irradiation. The photoluminescence (PL) spectrum is dominated by the defect band and the effect of irradiation has been discussed and correlated with the observed change in the XRD peak position and optical band gap. Springer Science+Business Media, LLC, 2007 Sathyamoorthy R. PG and Research Department of Physics, Kongunadu Arts & Science College, 641 029, Coimbatore, Tamilnadu, India aut Chandramohan S. PG and Research Department of Physics, Kongunadu Arts & Science College, 641 029, Coimbatore, Tamilnadu, India aut Sudhagar P. PG and Research Department of Physics, Kongunadu Arts & Science College, 641 029, Coimbatore, Tamilnadu, India aut Kanjilal D. Inter University Accelerator Centre (IUAC), Aruna Asaf Ali Marg, 110 067, New Delhi, India aut Kabiraj D. Inter University Accelerator Centre (IUAC), Aruna Asaf Ali Marg, 110 067, New Delhi, India aut Asokan K. Inter University Accelerator Centre (IUAC), Aruna Asaf Ali Marg, 110 067, New Delhi, India aut Vijayakumar K. Department of Physics, Cochin University of Science and Technology, 682 022, Cochin, Kerala, India aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/16(2007-08-01), 6982-6988 0022-2461 42:16<6982 2007 42 10853 https://doi.org/10.1007/s10853-006-1248-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-1248-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Sathyamoorthy R. PG and Research Department of Physics, Kongunadu Arts & Science College, 641 029, Coimbatore, Tamilnadu, India aut NATIONALLICENCE 700 1- Chandramohan S. PG and Research Department of Physics, Kongunadu Arts & Science College, 641 029, Coimbatore, Tamilnadu, India aut NATIONALLICENCE 700 1- Sudhagar P. PG and Research Department of Physics, Kongunadu Arts & Science College, 641 029, Coimbatore, Tamilnadu, India aut NATIONALLICENCE 700 1- Kanjilal D. Inter University Accelerator Centre (IUAC), Aruna Asaf Ali Marg, 110 067, New Delhi, India aut NATIONALLICENCE 700 1- Kabiraj D. Inter University Accelerator Centre (IUAC), Aruna Asaf Ali Marg, 110 067, New Delhi, India aut NATIONALLICENCE 700 1- Asokan K. Inter University Accelerator Centre (IUAC), Aruna Asaf Ali Marg, 110 067, New Delhi, India aut NATIONALLICENCE 700 1- Vijayakumar K. Department of Physics, Cochin University of Science and Technology, 682 022, Cochin, Kerala, India aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/16(2007-08-01), 6982-6988 0022-2461 42:16<6982 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer