<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">463221990</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180405153215.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170326e20070801xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s10853-006-1306-y</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s10853-006-1306-y</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Effects of hydrogenation and aging on the optical properties in porous Si layers</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Do-Hyun Oh, Soojin Lee, Woon-Jo Cho, Tae Kim]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">The effects of hydrogenation and aging on the optical properties in porous Si (PS) layers were investigated by using photoluminescence (PL) measurements. When the hydrogenated PS layers were aged in air, the intensity of the PL spectrum increased. The emission peak for the hydrogenated PS layers shifted to higher energy with decreasing H2/N2 ratio. The relation of the dehydrogenized states in the as-formed PS surface to the quantum states of Si nanoparticles with relatively small sizes is discussed. These results indicate that the optical properties of PS layers are significantly affected by hydrogenation and aging.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Springer Science+Business Media, LLC, 2007</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Oh</subfield>
   <subfield code="D">Do-Hyun</subfield>
   <subfield code="u">Nano Device Research Center, Korea Institute of Science &amp; Technology, 136-791, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Lee</subfield>
   <subfield code="D">Soojin</subfield>
   <subfield code="u">Nano Device Research Center, Korea Institute of Science &amp; Technology, 136-791, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Cho</subfield>
   <subfield code="D">Woon-Jo</subfield>
   <subfield code="u">Nano Device Research Center, Korea Institute of Science &amp; Technology, 136-791, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Kim</subfield>
   <subfield code="D">Tae</subfield>
   <subfield code="u">Advanced Semiconductor Research Center, Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, 133-791, Seongdong-gu, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Materials Science</subfield>
   <subfield code="d">Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com</subfield>
   <subfield code="g">42/16(2007-08-01), 6862-6865</subfield>
   <subfield code="x">0022-2461</subfield>
   <subfield code="q">42:16&lt;6862</subfield>
   <subfield code="1">2007</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">10853</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s10853-006-1306-y</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s10853-006-1306-y</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Oh</subfield>
   <subfield code="D">Do-Hyun</subfield>
   <subfield code="u">Nano Device Research Center, Korea Institute of Science &amp; Technology, 136-791, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Lee</subfield>
   <subfield code="D">Soojin</subfield>
   <subfield code="u">Nano Device Research Center, Korea Institute of Science &amp; Technology, 136-791, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Cho</subfield>
   <subfield code="D">Woon-Jo</subfield>
   <subfield code="u">Nano Device Research Center, Korea Institute of Science &amp; Technology, 136-791, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Kim</subfield>
   <subfield code="D">Tae</subfield>
   <subfield code="u">Advanced Semiconductor Research Center, Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, 133-791, Seongdong-gu, Seoul, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Materials Science</subfield>
   <subfield code="d">Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com</subfield>
   <subfield code="g">42/16(2007-08-01), 6862-6865</subfield>
   <subfield code="x">0022-2461</subfield>
   <subfield code="q">42:16&lt;6862</subfield>
   <subfield code="1">2007</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">10853</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
