caa a22 4500 463222148 CHVBK 20180405153215.0 cr unu---uuuuu 170326e20070801xx s 000 0 eng 10.1007/s10853-007-1564-3 doi (NATIONALLICENCE)springer-10.1007/s10853-007-1564-3 Impedance and modulus spectra of the percolation system silicon-polyester resin and their analysis using the two exponent phenomenological percolation equation [Elektronische Daten] [Godfrey Sauti, David McLachlan] The ac conductivity of silicon-polyester resin composites is found to be best fitted using the two exponent phenomenological percolation equation (TEPPE) (formerly known as the general effective media (GEM) equation). The results show that, with the actual experimentally measured components' electrical properties as input, the TEPPE can be used to model and fit the composites' complex conductivity data. The paper also highlights the importance of using several representations of the immittance spectroscopy data in order to correctly identify the various contributions, for instance the modulus plots clearly show the arcs due to the isolated percolation clusters, below the critical volume fraction. Springer Science+Business Media, LLC, 2007 Sauti Godfrey School of Physics and Materials Physics Research Institute, University of the Witwatersrand, P. Bag 3, 2050, Wits, South Africa aut McLachlan David School of Physics and Materials Physics Research Institute, University of the Witwatersrand, P. Bag 3, 2050, Wits, South Africa aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/16(2007-08-01), 6477-6488 0022-2461 42:16<6477 2007 42 10853 https://doi.org/10.1007/s10853-007-1564-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-007-1564-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Sauti Godfrey School of Physics and Materials Physics Research Institute, University of the Witwatersrand, P. Bag 3, 2050, Wits, South Africa aut NATIONALLICENCE 700 1- McLachlan David School of Physics and Materials Physics Research Institute, University of the Witwatersrand, P. Bag 3, 2050, Wits, South Africa aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/16(2007-08-01), 6477-6488 0022-2461 42:16<6477 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer