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   <subfield code="a">Stress-impedance effects in sandwiched FeCuNbCrSiB/Cu/FeCuNbCrSiB films fabricated by Microelectromechanical Systems technique</subfield>
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   <subfield code="c">[Zhimin Zhou, Ying Cao, Yong Zhou, Ji-An Chen, Wen Ding]</subfield>
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   <subfield code="a">Sandwiched FeCuNbCrSiB/Cu/FeCuNbCrSiB films with a serpentine structure have been realized on silicon cantilever by Microelectromechanical Systems technique, and the stress-impedance (SI) effects have been studied in the frequency range of 1-40MHz. Experimental results show that the values of SI ratio increase with the deflection and a large SI ratio of −24.1% at 5MHz with the average tension stress 69.9MPa and strain 0.048% is obtained in the sandwiched FeCuNbCrSiB/Cu/FeCuNbCrSiB films, which shows attractive for the applications of strain sensors.</subfield>
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