caa a22 4500 463228650 CHVBK 20180405153235.0 cr unu---uuuuu 170326e20070901xx s 000 0 eng 10.1007/s10853-006-1310-2 doi (NATIONALLICENCE)springer-10.1007/s10853-006-1310-2 Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF [Elektronische Daten] [Rainer Dargel, Mohamed Azeroual, Boris Mogwitz, Juergen Janek, Carla Vogt] Thin films of silver selenide with varying composition have been deposited on magnesium oxide substrates with pulsed laser deposition and were investigated via micro-XRF. A calibration procedure was designed to determine the absolute thicknesses of the films. The lateral homogeneity was investigated by elemental mapping, thus delivering information about the deposition process. Wet chemical analysis was performed on the dissolved layers with ICP-OES and ICP-MS to determine the stoichiometry of the Ag x Se y . The results suggest a correlation between the composition of the layers and their thicknesses by showing a silver enrichment for thinner layers. Springer Science+Business Media, LLC, 2007 Dargel Rainer Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany aut Azeroual Mohamed Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany aut Mogwitz Boris Institute of Physical Chemistry, University of Giessen, Heinrich-Buff-Ring 58, 35392, Giessen, Germany aut Janek Juergen Institute of Physical Chemistry, University of Giessen, Heinrich-Buff-Ring 58, 35392, Giessen, Germany aut Vogt Carla Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/17(2007-09-01), 7375-7380 0022-2461 42:17<7375 2007 42 10853 https://doi.org/10.1007/s10853-006-1310-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-1310-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Dargel Rainer Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany aut NATIONALLICENCE 700 1- Azeroual Mohamed Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany aut NATIONALLICENCE 700 1- Mogwitz Boris Institute of Physical Chemistry, University of Giessen, Heinrich-Buff-Ring 58, 35392, Giessen, Germany aut NATIONALLICENCE 700 1- Janek Juergen Institute of Physical Chemistry, University of Giessen, Heinrich-Buff-Ring 58, 35392, Giessen, Germany aut NATIONALLICENCE 700 1- Vogt Carla Department of Analytical Chemistry, Institute for Inorganic Chemistry, University of Hannover, Callinstr. 9, 30167, Hannover, Germany aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/17(2007-09-01), 7375-7380 0022-2461 42:17<7375 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer