<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">463230256</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180405153239.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170326e20070201xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s10853-006-1195-0</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s10853-006-1195-0</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Efficient and stable field emission from the oxidized porous polysilicon using Pt/Ti multilayer electrode</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Seong-Chan Bae, Sie-Young Choi]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">The field emission characteristics of an oxidized porous polysilicon (OPPS) were investigated with a Pt/Ti multilayer electrode, which showed highly efficient and stable electron emission characteristics compared with those of conventional Au/NiCr electrodes. The thin Ti layer played an important role in promoting the adhesion of Pt to SiO2 surface and the distribution of the electric field on the OPPS surface. Additionally, the Ti layer efficiently blocked the diffusion of emitter metal, which resulted in more reliable emission characteristics.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Springer Science+Business Media, LLC, 2006</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Bae</subfield>
   <subfield code="D">Seong-Chan</subfield>
   <subfield code="u">School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, buk-gu, 702-701, Daegu, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Choi</subfield>
   <subfield code="D">Sie-Young</subfield>
   <subfield code="u">School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, buk-gu, 702-701, Daegu, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Materials Science</subfield>
   <subfield code="d">Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com</subfield>
   <subfield code="g">42/4(2007-02-01), 1369-1375</subfield>
   <subfield code="x">0022-2461</subfield>
   <subfield code="q">42:4&lt;1369</subfield>
   <subfield code="1">2007</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">10853</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s10853-006-1195-0</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s10853-006-1195-0</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Bae</subfield>
   <subfield code="D">Seong-Chan</subfield>
   <subfield code="u">School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, buk-gu, 702-701, Daegu, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Choi</subfield>
   <subfield code="D">Sie-Young</subfield>
   <subfield code="u">School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, buk-gu, 702-701, Daegu, Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Materials Science</subfield>
   <subfield code="d">Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com</subfield>
   <subfield code="g">42/4(2007-02-01), 1369-1375</subfield>
   <subfield code="x">0022-2461</subfield>
   <subfield code="q">42:4&lt;1369</subfield>
   <subfield code="1">2007</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">10853</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
