caa a22 4500 463230418 CHVBK 20180405153240.0 cr unu---uuuuu 170326e20070401xx s 000 0 eng 10.1007/s10853-006-0690-7 doi (NATIONALLICENCE)springer-10.1007/s10853-006-0690-7 Comments on the phenomena underlying pressure stimulated currents in dielectric rock materials [Elektronische Daten] [C. Anastasiadis, D. Triantis, C. Hogarth] It has been observed that there is a systematic detection of weak pressure stimulated electric currents (PSC) in polycrystalline and amorphous solids during or after an application of mechanical stress upon them. An interpretation of the mechanisms governing the electrical behaviour of solid structures when they undergo uniaxial stress tests is presented. In numerous experiments, repetitive stress loadings and unloadings have been conducted, the corresponding PSC have been recorded, and the behaviour of the material is interpreted with respect to PSC emission. The dominant conclusion is that the behaviour of the solid depends on the overall stress it has suffered and that PSC is related with a memory effect which associates current emission with the previous history of the sample. Springer Science+Business Media, LLC, 2007 Anastasiadis C. Department of Electronics, Technological Educational Institution (TEI) of Athens, 122 10, Athens, Greece aut Triantis D. Department of Electronics, Technological Educational Institution (TEI) of Athens, 122 10, Athens, Greece aut Hogarth C. Department of Electronic & Computer Engineering, Brunel University, Uxbridge, UK aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/8(2007-04-01), 2538-2542 0022-2461 42:8<2538 2007 42 10853 https://doi.org/10.1007/s10853-006-0690-7 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-0690-7 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Anastasiadis C. Department of Electronics, Technological Educational Institution (TEI) of Athens, 122 10, Athens, Greece aut NATIONALLICENCE 700 1- Triantis D. Department of Electronics, Technological Educational Institution (TEI) of Athens, 122 10, Athens, Greece aut NATIONALLICENCE 700 1- Hogarth C. Department of Electronic & Computer Engineering, Brunel University, Uxbridge, UK aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/8(2007-04-01), 2538-2542 0022-2461 42:8<2538 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer