caa a22 4500 463230809 CHVBK 20180405153241.0 cr unu---uuuuu 170326e20070401xx s 000 0 eng 10.1007/s10853-006-1373-0 doi (NATIONALLICENCE)springer-10.1007/s10853-006-1373-0 Effects of nanocrystalline ferrite particles on densification and magnetic properties of the NiCuZn ferrites [Elektronische Daten] [Hua Su, Huaiwu Zhang, Xiaoli Tang, Yingli Liu] Effects of nanocrystalline ferrite particles addition on densification behavior and magnetic properties of the NiCuZn ferrites were investigated. It was confirmed that nanocrystalline ferrite particles enhanced densification of the samples obviously. The reason was attributed to the nanocrystalline particles, which spread around the micron-sized ferrite particles, increased contacting area and inter-diffusion of the particles. When the amount of nanocrystalline particles addition reached to 30wt%, the samples obtained an approximate densification behavior as the 1.5wt% Bi2O3 added samples. Due to relatively bigger grain size, higher sintering density and no different chemical composition sintering aids added, the sample with 30wt% nanocrystalline ferrite particles got the highest permeability and relatively high Q-factor when sintered at 900. Springer Science+Business Media, LLC, 2007 Su Hua State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut Zhang Huaiwu State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut Tang Xiaoli State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut Liu Yingli State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/8(2007-04-01), 2849-2853 0022-2461 42:8<2849 2007 42 10853 https://doi.org/10.1007/s10853-006-1373-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-1373-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Su Hua State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut NATIONALLICENCE 700 1- Zhang Huaiwu State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut NATIONALLICENCE 700 1- Tang Xiaoli State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut NATIONALLICENCE 700 1- Liu Yingli State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No.4 Sect. 2, Jianshe North Road, 610054, ChengDu, China aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/8(2007-04-01), 2849-2853 0022-2461 42:8<2849 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer