caa a22 4500 463230914 CHVBK 20180405153241.0 cr unu---uuuuu 170326e20070301xx s 000 0 eng 10.1007/s10853-006-0696-1 doi (NATIONALLICENCE)springer-10.1007/s10853-006-0696-1 Ungár Tamás Department of Materials Physics, Eötvös University Budapest, Budapest, Hungary aut Characterization of nanocrystalline materials by X-ray line profile analysis [Elektronische Daten] [Tamás Ungár] X-ray line profile analysis is shown to be a powerful tool to characterize the microstructure of nanocrystalline materials in terms of grain and subgrain size, dislocation structure and dislocation densities and planar defects, especially stacking faults and twin boundaries. It is shown that the X-ray method can provide valuable complementary information about the microstructure, especially when combined with transmission electron microscopy and differential scanning calorimetry. Springer Science+Business Media, LLC, 2006 Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/5(2007-03-01), 1584-1593 0022-2461 42:5<1584 2007 42 10853 https://doi.org/10.1007/s10853-006-0696-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-0696-1 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Ungár Tamás Department of Materials Physics, Eötvös University Budapest, Budapest, Hungary aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/5(2007-03-01), 1584-1593 0022-2461 42:5<1584 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer