caa a22 4500 463232860 CHVBK 20180405153247.0 cr unu---uuuuu 170326e20070701xx s 000 0 eng 10.1007/s10853-006-0825-x doi (NATIONALLICENCE)springer-10.1007/s10853-006-0825-x X-ray diffraction, optical absorption and emission studies on Er3+- and Er3+/Yb3+-doped Li3NbO4 powder [Elektronische Daten] [De-Long Zhang, Jia Kang, E. Pun] Er3+(/Yb3+)-doped Li3NbO4 powder were prepared by thermally sintering mixtures of Er2O3 (0.5, 1.0mol%), Yb2O3 (0, 0.5, 1.0mol%), Li2CO3 (48-49mol%) and Nb2O5 (50mol%) at 1125, 1150 and 1450°C over the durations of 8-22h. The crystalline phases contained in these samples were determined by using X-ray diffraction and discussed in comparison with a vapor-transport-equilibration-treated (VTE-treated) Er(2.0mol%):LiNbO3 single crystal and ErNbO4 powder previously reported. The results show that the X-ray patterns of the rare-earth-doped samples reveal little difference each other, but large differences with those of the VTE crystal and ErNbO4 powder. The doped rare-earth ions Er3+ (and Yb3+) present in the powder as the ErNbO4 (and YbNbO4) phase(s). The possibility that the highly Er-doped LiNbO3 crystal contains Li3NbO4 precipitates is small. Optical absorption and emission studies show that the only Er-doped Li3NbO4 powder shows similar absorption and emission characteristics with the pure ErNbO4. The codopant Yb3+ ion enhances the 980-nm-upconversion emissions of Er3+ ions, results in remarkable spectral alterations at 0.98μm region, and causes the alterations of relative absorbance and relative emission intensity of individual peaks or bands at 1.5μm region. On the other hand, the Yb-codoping hardly affects the Er3+ energy structure and the lifetime of Er3+ ion at 1.5μm. The measured lifetimes at 1.5μm of Er3+ ions in the singly Er3+- and doubly Er3+/Yb3+-doped mixtures have a nearly same value of ∼ 1.5ms. For the pure ErNbO4 powder, the lifetime is prolonged to ∼2ms perhaps due to radiation trapping effect. Springer Science+Business Media, LLC, 2007 Zhang De-Long Department of Opto-electronics and Information Engineering, College of Precision Instruments and Opto-electronics Engineering, Tianjin University, 300072, Tianjin, P. R. China aut Kang Jia Department of Opto-electronics and Information Engineering, College of Precision Instruments and Opto-electronics Engineering, Tianjin University, 300072, Tianjin, P. R. China aut Pun E. Department of Electronic Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, P. R. China aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/13(2007-07-01), 4731-4737 0022-2461 42:13<4731 2007 42 10853 https://doi.org/10.1007/s10853-006-0825-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-0825-x text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Zhang De-Long Department of Opto-electronics and Information Engineering, College of Precision Instruments and Opto-electronics Engineering, Tianjin University, 300072, Tianjin, P. R. China aut NATIONALLICENCE 700 1- Kang Jia Department of Opto-electronics and Information Engineering, College of Precision Instruments and Opto-electronics Engineering, Tianjin University, 300072, Tianjin, P. R. China aut NATIONALLICENCE 700 1- Pun E. Department of Electronic Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, P. R. China aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/13(2007-07-01), 4731-4737 0022-2461 42:13<4731 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer