caa a22 4500 463234030 CHVBK 20180405153251.0 cr unu---uuuuu 170326e20070601xx s 000 0 eng 10.1007/s10853-006-0413-0 doi (NATIONALLICENCE)springer-10.1007/s10853-006-0413-0 Candidate mechanisms controlling the electrical characteristics of silica/XLPE nanodielectrics [Elektronische Daten] [Mihir Roy, J. Nelson, R. MacCrone, L. Schadler] The incorporation of silica nanoparticles into polyethylene has been shown to increase the breakdown strength significantly compared to composites with micron scale fillers. Additionally, the voltage endurance of the nanocomposites is two orders of magnitude higher than that of the base polymer. The most significant difference between micron-scale and nano-scale fillers is the large interfacial area in nanocomposites. Because the interfacial region (interaction zone) is likely to be pivotal in controlling properties, this paper compares the behavior of nanoscale silica/cross-linked low density polyethylene nanocomposites with several silica surface treatments. In addition to breakdown strength and voltage endurance, dielectric spectroscopy, absorption current measurements, and thermally stimulated current determinations (TSC) were performed to elucidate the role of the interface. It was found that a reduction in the mobility in nanocomposites as well as a change in the defect size may be key to explaining the improvement in the properties. Springer Science+Business Media, LLC, 2007 Roy Mihir Materials Science and Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut Nelson J. Electrical, Computer, and Systems Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut MacCrone R. Materials Science and Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut Schadler L. Materials Science and Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/11(2007-06-01), 3789-3799 0022-2461 42:11<3789 2007 42 10853 https://doi.org/10.1007/s10853-006-0413-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10853-006-0413-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Roy Mihir Materials Science and Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut NATIONALLICENCE 700 1- Nelson J. Electrical, Computer, and Systems Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut NATIONALLICENCE 700 1- MacCrone R. Materials Science and Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut NATIONALLICENCE 700 1- Schadler L. Materials Science and Engineering Department, Rensselaer Polytechnic Institute, 12180, Troy, NY, USA aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 42/11(2007-06-01), 3789-3799 0022-2461 42:11<3789 2007 42 10853 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer