Electrical and structural characterization of inhomogeneously doped semiconductors by infrared spectroscopy

Verfasser / Beitragende:
[R. Nies, F. Kessler, U. Scheuermann, H. Luka]
Ort, Verlag, Jahr:
1990
Enthalten in:
International Journal of Infrared and Millimeter Waves, 11/2(1990-02-01), 227-242
Format:
Artikel (online)
ID: 46558800X