Temperature and magnetic field dependence of NbN film resistivity: 3D weak localization effects

Verfasser / Beitragende:
[Y. Pellan, G. Dousselin, J. Pinel, Y. Sohn]
Ort, Verlag, Jahr:
1990
Enthalten in:
Journal of Low Temperature Physics, 78/1-2(1990-01-01), 63-77
Format:
Artikel (online)
ID: 465614302