caa a22 4500 465732224 CHVBK 20180323111744.0 cr unu---uuuuu 170327e19900801xx s 000 0 eng 10.1007/BF02035810 doi (NATIONALLICENCE)springer-10.1007/BF02035810 Trace analysis of lithium metal by PIXE [Elektronische Daten] [P. Dahmi, B. Jangida, M. Sundaresan] A rapid method is described for simultaneous trace determination of metallic impurities in lithium metal by Particle Induced X-ray Emission (PIXE) technique. The impurities were preconcentrated by ion-exchange separation using a weak cation exchanger, Bio Rex-70 and analyzed by 2.34 MeV protons. The reliability of the method was tested by analyzing synthetic samples having several metallic impurities at 1-5 ppm range. Akadémiai Kiadó, 1990 Dahmi P. Fuel Reprocessing Division, Bombay, India aut Jangida B. Analytical Chemistry Division, Bhabha Atomic Research Centre, Trombay, 400085, Bombay, India aut Sundaresan M. Analytical Chemistry Division, Bhabha Atomic Research Centre, Trombay, 400085, Bombay, India aut Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 141/2(1990-08-01), 437-441 0236-5731 141:2<437 1990 141 10967 https://doi.org/10.1007/BF02035810 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02035810 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Dahmi P. Fuel Reprocessing Division, Bombay, India aut NATIONALLICENCE 700 1- Jangida B. Analytical Chemistry Division, Bhabha Atomic Research Centre, Trombay, 400085, Bombay, India aut NATIONALLICENCE 700 1- Sundaresan M. Analytical Chemistry Division, Bhabha Atomic Research Centre, Trombay, 400085, Bombay, India aut NATIONALLICENCE 773 0- Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 141/2(1990-08-01), 437-441 0236-5731 141:2<437 1990 141 10967 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer