caa a22 4500 46574236X CHVBK 20180323111811.0 cr unu---uuuuu 170327e19901101xx s 000 0 eng 10.1007/BF00935210 doi (NATIONALLICENCE)springer-10.1007/BF00935210 A low-overhead scheme for testing a bit-level finite ring systolic array [Elektronische Daten] [G. Jullien, S. Bandyopadhyay, W. Miller, M. Taheri] Testing large VLSI circuits is a difficult and challenging problem for designers. Large unstructured circuits are often impossible to test. The number of test vectors also tend to be large and difficult to generate using automated tools for testing. In this paper, we have investigated the testing of systolic arrays built from a finite ring cell that has been proposed recently for digital signal processing functions. The cell has been shown to allow encoding, decoding and general inner product type computations for residue number system applications, with considerable advantages over equivalent binary implementation. As a further feature, we show, in this paper, that an array of such cells is remarkably easy to test for stuck-at faults. Generating test vectors for these arrays is also straightforward. Kluwer Academic Publishers, 1990 Jullien G. VLSI Research Group, University of Windsor, N9B 3P4, Windsor, Ontario, Canada aut Bandyopadhyay S. VLSI Research Group, University of Windsor, N9B 3P4, Windsor, Ontario, Canada aut Miller W. VLSI Research Group, University of Windsor, N9B 3P4, Windsor, Ontario, Canada aut Taheri M. Bell-Northern Research, Ottawa, Canada aut Journal of VLSI signal processing systems for signal, image and video technology Springer Netherlands 2/3(1990-11-01), 131-137 0922-5773 2:3<131 1990 2 11265 https://doi.org/10.1007/BF00935210 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00935210 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Jullien G. VLSI Research Group, University of Windsor, N9B 3P4, Windsor, Ontario, Canada aut NATIONALLICENCE 700 1- Bandyopadhyay S. VLSI Research Group, University of Windsor, N9B 3P4, Windsor, Ontario, Canada aut NATIONALLICENCE 700 1- Miller W. VLSI Research Group, University of Windsor, N9B 3P4, Windsor, Ontario, Canada aut NATIONALLICENCE 700 1- Taheri M. Bell-Northern Research, Ottawa, Canada aut NATIONALLICENCE 773 0- Journal of VLSI signal processing systems for signal, image and video technology Springer Netherlands 2/3(1990-11-01), 131-137 0922-5773 2:3<131 1990 2 11265 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer