caa a22 4500 465755186 CHVBK 20180323111845.0 cr unu---uuuuu 170327e19900101xx s 000 0 eng 10.1007/BF00503855 doi (NATIONALLICENCE)springer-10.1007/BF00503855 Ellipsometry of the liquid-vapor interface close to the critical point: A theoretical analysis [Elektronische Daten] [D. Bedeaux, E. Blokhuis, J. Schmidt] It is shown that the ellipsometric coefficient for a liquid-vapor interface may be written as the sum of three contributions. The first is given by Drude's formula. The second contribution is due to capillary wave fluctuations. Finally, the third contribution is due to fluctuations of the density profile around the Fisk-Widom profile with a wavelength up to roughly the bulk correlation length and thus short compared to the capillary length. Close to the critical point the first two contributions scale as (T - T c ) β-υ . The expression for the third contribution contains an integral over the excess density correlation function over wave vectors large compared to the inverse bulk correlation length. The scaling behavior of the third contribution is probably such that this term becomes unimportant close to the critical point. The formulae given in this paper only for the liquid-vapor interface may be used for a binary fluid if one makes the usual substitutions. An experimental analysis of the ellipsometric coefficient for binary fluids close to the critical point by Schmidt [1] indicates that the sum of the first two terms predicts a value which is somewhat to large but which has the correct scaling behavior. A discussion of this difference in amplitude is given. Plenum Publishing Corporation, 1990 critical point nationallicence ellipsometric coefficient nationallicence liquid-vapor interface nationallicence Bedeaux D. Department of Physical and Macromolecular Chemistry, Gorlaeus Laboratories, University of Leiden, P.O.B. 9502, 2300, RA Leiden, The Netherlands aut Blokhuis E. Department of Physical and Macromolecular Chemistry, Gorlaeus Laboratories, University of Leiden, P.O.B. 9502, 2300, RA Leiden, The Netherlands aut Schmidt J. Thermophysics Division, National Institute of Standards and Technology, 20899, Gaithersburg, Maryland, USA aut International Journal of Thermophysics Kluwer Academic Publishers-Plenum Publishers 11/1(1990-01-01), 13-24 0195-928X 11:1<13 1990 11 10765 https://doi.org/10.1007/BF00503855 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00503855 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Bedeaux D. Department of Physical and Macromolecular Chemistry, Gorlaeus Laboratories, University of Leiden, P.O.B. 9502, 2300, RA Leiden, The Netherlands aut NATIONALLICENCE 700 1- Blokhuis E. Department of Physical and Macromolecular Chemistry, Gorlaeus Laboratories, University of Leiden, P.O.B. 9502, 2300, RA Leiden, The Netherlands aut NATIONALLICENCE 700 1- Schmidt J. Thermophysics Division, National Institute of Standards and Technology, 20899, Gaithersburg, Maryland, USA aut NATIONALLICENCE 773 0- International Journal of Thermophysics Kluwer Academic Publishers-Plenum Publishers 11/1(1990-01-01), 13-24 0195-928X 11:1<13 1990 11 10765 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer