Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

Authors / Contributors:
[F. Müller, A.-D. Müller, S. Schulze, M. Hietschold]
Place, publisher, year:
2004
Contained in:
Journal of Materials Science, 39/9(2004-05-01), 3199-3200
Format:
Article (online)
ID: 466335326