caa a22 4500 467893136 CHVBK 20180406152754.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10955-006-9030-1 doi (NATIONALLICENCE)springer-10.1007/s10955-006-9030-1 Yip Sidney Department of Nuclear Science and Engineering and Materials Science and Engineering, Massachusetts Institute of Technology, 02139, Cambridge, MA, USA aut Soft-Mode Scenarios of Shear Localization: Atomic-Level Landscapes [Elektronische Daten] [Sidney Yip] Using an elementary case study of stress-induced structural instability in a crystal we discuss how collective response to large-strain deformation at the atomic level can give insights into the mechanistic nature of shear localization. Stability criteria and reaction pathway sampling are used to probe saddle-point configurations, both local spatial coordinates and activation energy barriers, to optimally extract the information available from molecular dynamics simulations. Springer Science + Business Media, Inc., 2006 shear instability in solids nationallicence stress-induced structural transitions nationallicence shear localization nationallicence dislocation slip and deformation twin nationallicence atomic-level insights nationallicence atomistic simulations nationallicence scenarios of localization phenomena nationallicence Journal of Statistical Physics Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 125/5-6(2006-12-01), 1109-1120 0022-4715 125:5-6<1109 2006 125 10955 https://doi.org/10.1007/s10955-006-9030-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10955-006-9030-1 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Yip Sidney Department of Nuclear Science and Engineering and Materials Science and Engineering, Massachusetts Institute of Technology, 02139, Cambridge, MA, USA aut NATIONALLICENCE 773 0- Journal of Statistical Physics Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 125/5-6(2006-12-01), 1109-1120 0022-4715 125:5-6<1109 2006 125 10955 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer