caa a22 4500 46792127X CHVBK 20180406152917.0 cr unu---uuuuu 170328e20060201xx s 000 0 eng 10.1007/s10836-006-4835-z doi (NATIONALLICENCE)springer-10.1007/s10836-006-4835-z Scaling of i DDT Test Methods for Random Logic Circuits [Elektronische Daten] [Ali Chehab, Saurabh Patel, Rafic Makki] We present a scaling methodology to improve iDDT fault coverage in random logic circuits. The study targets two iDDT test methods: Double Threshold iDDT and Delayed iDDT. The effectiveness of the scaling methodology is assessed through physical test measurements, and studied relative to process variation and impact on circuit performance. The scaling is made possible using a clustering methodology that can significantly improve fault coverage. The results show that without clustering, the effectiveness of the iDDT testing methods considered is greatly reduced as the circuit size increases. Springer Science + Business Media, Inc, 2006 dynamic power supply current nationallicence design for current testability nationallicence resistive opens nationallicence resistive bridges nationallicence fault simulation nationallicence very deep sub-micron technologies nationallicence VDSM nationallicence Chehab Ali American University of Beirut, Beirut, Lebanon aut Patel Saurabh University of North Carolina at Charlotte, 28223, Charlotte, NC, USA aut Makki Rafic College of Information Technology, UAE University, AL-Ain, UAE aut Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 11-22 0923-8174 22:1<11 2006 22 10836 https://doi.org/10.1007/s10836-006-4835-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-4835-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chehab Ali American University of Beirut, Beirut, Lebanon aut NATIONALLICENCE 700 1- Patel Saurabh University of North Carolina at Charlotte, 28223, Charlotte, NC, USA aut NATIONALLICENCE 700 1- Makki Rafic College of Information Technology, UAE University, AL-Ain, UAE aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 11-22 0923-8174 22:1<11 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer