caa a22 4500 467921296 CHVBK 20180406152917.0 cr unu---uuuuu 170328e20060201xx s 000 0 eng 10.1007/s10836-006-5549-y doi (NATIONALLICENCE)springer-10.1007/s10836-006-5549-y A Self Test Program Design Technique for Embedded DSP Cores [Elektronische Daten] [Hani Rizk, Chris Papachristou, Francis Wolff] This paper describes a self test program design technique for embedded DSP cores. The method requires minimal knowledge of the core's internals and minimal insertion of external LFSR hardware, without scan insertions. The test program consists of a small set of instructions which operate iteratively on pseudorandom data generated by the LFSRs to fully test the DSP core components. The method uses instruction-based test metrics and a program template as a blueprint to generate the test program. The self test scheme has been successfully applied on an industrial-strength DSP core and the results compare favorably to other methods using ATPG and pseudorandom BIST. Springer Science + Business Media, Inc, 2006 self test programs nationallicence ATPG nationallicence pseudorandom BIST nationallicence DSP nationallicence LSFR nationallicence Rizk Hani Electrical Engineering and Computer Science, Case Western Reserve University, 44106, Cleveland, OH aut Papachristou Chris Electrical Engineering and Computer Science, Case Western Reserve University, 44106, Cleveland, OH aut Wolff Francis Electrical Engineering and Computer Science, Case Western Reserve University, 44106, Cleveland, OH aut Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 71-87 0923-8174 22:1<71 2006 22 10836 https://doi.org/10.1007/s10836-006-5549-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-5549-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Rizk Hani Electrical Engineering and Computer Science, Case Western Reserve University, 44106, Cleveland, OH aut NATIONALLICENCE 700 1- Papachristou Chris Electrical Engineering and Computer Science, Case Western Reserve University, 44106, Cleveland, OH aut NATIONALLICENCE 700 1- Wolff Francis Electrical Engineering and Computer Science, Case Western Reserve University, 44106, Cleveland, OH aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 71-87 0923-8174 22:1<71 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer