caa a22 4500 46792130X CHVBK 20180406152917.0 cr unu---uuuuu 170328e20060201xx s 000 0 eng 10.1007/s10836-006-6392-x doi (NATIONALLICENCE)springer-10.1007/s10836-006-6392-x Automatic Test Pattern Generation for Resistive Bridging Faults [Elektronische Daten] [Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker] An ATPG for resistive bridging faults in combinational or full-scan circuits is proposed. It combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced so far, it can handle static effects of arbitrary non-feedback bridges between two nodes, including ones detectable at higher bridge resistance and undetectable at lower resistance, and faults requiring more than one vector for detection. The developed tool is applied to ISCAS circuits, and a higher efficiency compared with other resistive bridging fault as well as stuck-at ATPG is reported. Information required for accurate resistive bridging fault simulation is obtained as a by-product. Springer Science+Business Media, Inc, 2006 ATPG nationallicence resistive short defects nationallicence bridging faults nationallicence SAT nationallicence Engelke Piet Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany aut Polian Ilia Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany aut Renovell Michel LIRMM - UMII, 161 Rue Ada, 34392, Montpellier, France aut Becker Bernd Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany aut Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 61-69 0923-8174 22:1<61 2006 22 10836 https://doi.org/10.1007/s10836-006-6392-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-6392-x text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Engelke Piet Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany aut NATIONALLICENCE 700 1- Polian Ilia Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany aut NATIONALLICENCE 700 1- Renovell Michel LIRMM - UMII, 161 Rue Ada, 34392, Montpellier, France aut NATIONALLICENCE 700 1- Becker Bernd Institute of Computer Science, Albert-Ludwigs-University, Georges-Köhler-Allee 51, 79110, Freiburg im Breisgau, Germany aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 61-69 0923-8174 22:1<61 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer