caa a22 4500 467921326 CHVBK 20180406152917.0 cr unu---uuuuu 170328e20060201xx s 000 0 eng 10.1007/s10836-006-5854-x doi (NATIONALLICENCE)springer-10.1007/s10836-006-5854-x An Efficient Dictionary Organization for Maximum Diagnosis [Elektronische Daten] [Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang] The major problem of fault diagnosis with a fault dictionary is the enormous amount of data. The technique used to manage this data can have a significant effect on the outcome of the fault diagnosis procedure. If information is removed from a fault dictionary in order to reduce the size of the dictionary, its ability to diagnose stuck-at faults and unmodeled faults may be severely debased. Therefore, we focus on methods for producing a dictionary that is both small and lossless-compacted. We propose an efficient dictionary for maximum diagnosis, which is called SD-Dictionary. This dictionary consists of a static sub-dictionary and a dynamic sub-dictionary in order to make a smaller dictionary while maintaining the critical information needed for the diagnostic ability. Experimental results on ISCAS' 85, ISCAS' 89 and ITC' 99 benchmark circuits show that the size of the proposed dictionary is substantially reduced, while the dictionary retains most or all of the diagnostic capability of the full dictionary. Springer Science + Business Media, Inc, 2006 fault dictionary nationallicence static diagnosis nationallicence dynamic diagnosis nationallicence lossless compression nationallicence Chun Sunghoon Department of Electrical and Electronic Engineering, Yonsei University, 134, Shinchon-Dong Seodaemun-gu, Seoul, Korea aut Kim Sangwook LG Electronics Inc., 6 Woomyeon-Dong, Seocho-Gu, 137-724, Seoul, Korea aut Kim Hong-Sik Department of Electrical and Electronic Engineering, Yonsei University, 134, Shinchon-Dong Seodaemun-gu, Seoul, Korea aut Kang Sungho Department of Electrical and Electronic Engineering, Yonsei University, 134, Shinchon-Dong Seodaemun-gu, Seoul, Korea aut Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 37-48 0923-8174 22:1<37 2006 22 10836 https://doi.org/10.1007/s10836-006-5854-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-5854-x text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chun Sunghoon Department of Electrical and Electronic Engineering, Yonsei University, 134, Shinchon-Dong Seodaemun-gu, Seoul, Korea aut NATIONALLICENCE 700 1- Kim Sangwook LG Electronics Inc., 6 Woomyeon-Dong, Seocho-Gu, 137-724, Seoul, Korea aut NATIONALLICENCE 700 1- Kim Hong-Sik Department of Electrical and Electronic Engineering, Yonsei University, 134, Shinchon-Dong Seodaemun-gu, Seoul, Korea aut NATIONALLICENCE 700 1- Kang Sungho Department of Electrical and Electronic Engineering, Yonsei University, 134, Shinchon-Dong Seodaemun-gu, Seoul, Korea aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/1(2006-02-01), 37-48 0923-8174 22:1<37 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer